Lecture 10: Interface Damage & Negative Bias Temperature Instability

Update: 2010-02-02

Description

Outline:Background informationNBTI interpreted by R-D modelThe act of measurement and observed quantityNBTI vs. Light-induced DegradationPossibility of Degradation-free TransistorsConclusions

Comments

In Channel

Lecture 7: On Reliability and Randomness in Electronic Devices

2010-04-14--:--

Lecture 9: Breakdown in Thick Dielectrics

2010-04-05--:--

Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

2010-03-10--:--

Lecture 10: Interface Damage & Negative Bias Temperature Instability

2010-02-02--:--

Lecture 6: 3D Nets in a 3D World: Bulk Heterostructure Solar Cells

2009-10-27--:--

Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae

2009-10-27--:--

Lecture 4: Stick Percolation and Nanonet Electronics

2009-10-26--:--

Lecture 2: Threshold, Islands, and Fractals

2009-09-17--:--

Lecture 3: Electrical Conduction in Percolative Systems

2009-09-17--:--

Lecture 1: Percolation and Reliability of Electronic Devices

2009-09-17--:--

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Lecture 10: Interface Damage & Negative Bias Temperature Instability

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Lecture 10: Interface Damage & Negative Bias Temperature Instability

Muhammad A. Alam

Lecture 10: Interface Damage & Negative Bias Temperature Instability