Discover2013 Malaga (Spain) - Second IJFatigue & FFEMS Joint WorkshopHigh magnification crack-tip field characterisation under biaxial conditions
High magnification crack-tip field characterisation  under biaxial conditions

High magnification crack-tip field characterisation under biaxial conditions

Update: 2013-04-27
Share

Description

This work presents a novel methodology for characterising fatigue cracks under biaxial conditions. The methodology uses high magnification Digital Image Correlation (DIC) technique for measuring displacement and strain crack-tip fields. By applying micro-speckle pattern on the metal surface it is possible to achieve high magnification for DIC technique. The speckles were created by electro-spray technique. The validity of this novel technique is demonstrated by direct comparison with standard extensometer measurements, under tension-compression and torsion conditions. In order to image the correct region, the notch effect on the fatigue life was also evaluated.
Comments 
In Channel
loading
00:00
00:00
x

0.5x

0.8x

1.0x

1.25x

1.5x

2.0x

3.0x

Sleep Timer

Off

End of Episode

5 Minutes

10 Minutes

15 Minutes

30 Minutes

45 Minutes

60 Minutes

120 Minutes

High magnification crack-tip field characterisation  under biaxial conditions

High magnification crack-tip field characterisation under biaxial conditions

B. Moreno, P. Lopez-Crespo, J. Zapatero